TIME-RESOLVED DARK-FIELD X-RAY MICROSCOPY
Revealing Defect-Mediated Lattice Dynamics with Time-Resolved Dark-Field X-ray Microscopy
By combining pump–probe excitation with DFXM imaging of symmetry-breaking strain fields in the bulk, we visualize defect-mediated dynamics in Ge.DFXM experimental data and static · dynamic simulations support the observed contrast evolution and mode-conversion signatures.High X-ray penetration enables these dynamics to be imaged not only at the surface but throughout the bulk.